XU Ling-yun, YAN Li-juan. Replacement and Daily Maintenance of Tungsten Filament on EVO-18 Scanning Electron Microscope[J]. Analysis and Testing Technology and Instruments, 2018, 24(2): 115-119. DOI: 10.16495/j.1006-3757.2018.02.009
Citation:
XU Ling-yun, YAN Li-juan. Replacement and Daily Maintenance of Tungsten Filament on EVO-18 Scanning Electron Microscope[J]. Analysis and Testing Technology and Instruments, 2018, 24(2): 115-119. DOI: 10.16495/j.1006-3757.2018.02.009
XU Ling-yun, YAN Li-juan. Replacement and Daily Maintenance of Tungsten Filament on EVO-18 Scanning Electron Microscope[J]. Analysis and Testing Technology and Instruments, 2018, 24(2): 115-119. DOI: 10.16495/j.1006-3757.2018.02.009
Citation:
XU Ling-yun, YAN Li-juan. Replacement and Daily Maintenance of Tungsten Filament on EVO-18 Scanning Electron Microscope[J]. Analysis and Testing Technology and Instruments, 2018, 24(2): 115-119. DOI: 10.16495/j.1006-3757.2018.02.009
Replacement and Daily Maintenance of Tungsten Filament on EVO-18 Scanning Electron Microscope
Scanning electron microscope (SEM) has become an indispensable tool in universities and factories. Take the EVO-18 scanning electron microscope as an example, the details of filament replacement and daily maintenance of the tungsten filament was described.