Sharing and Management of Dual Beam (SEM/FIB) Electron Microscope with Cryo-Preparation System

Dual beam (SEM/FIB) electron microscope with the cryo-transfer system is an important method for the research of life science, medical science, food science, chemistry, material science and so on. It can be used to acquire high resolution images for the specimens with native state, and to prepare ultrathin lamellas with cryo-FIB milling for the vitrified specimens. The basic configurations of the microscope are introduced, and the management of the instrument, including the equipment sharing and efficiency, trouble shooting and maintenance are described. These will help to introduce scientific management of the instrument and provide valuable experience for the similar facility.