MAO Jing, GUO Qianying, MA Lili, LONG Lixia, HAN Yajing, MA Xiaohui. In-Situ Variable Temperature X-Ray Diffraction Testing Technology and Its Effecting Factors[J]. Analysis and Testing Technology and Instruments, 2023, 29(1): 111-116. DOI: 10.16495/j.1006-3757.2023.01.017
Citation: MAO Jing, GUO Qianying, MA Lili, LONG Lixia, HAN Yajing, MA Xiaohui. In-Situ Variable Temperature X-Ray Diffraction Testing Technology and Its Effecting Factors[J]. Analysis and Testing Technology and Instruments, 2023, 29(1): 111-116. DOI: 10.16495/j.1006-3757.2023.01.017

In-Situ Variable Temperature X-Ray Diffraction Testing Technology and Its Effecting Factors

  • By introducing a heating platform into the X-ray diffractometer, the in-situ variable temperature X-ray diffraction analysis can be achieved. The in-situ experiment is an effective means to study the dynamics of materials during the heating or cooling of materials. The requirements for variable temperature X-ray diffraction test samples, the principle of the measurement method, the test procedures for the Bruker D8 advance diffractometer with in-situ variable temperature were explored, and several problems that are frequently occur in the test process such as the shrinkage of samples during heating process, and interference of the diffraction peaks from substrate were described in detail. The method provides a specific experimental guidance for the high temperature X-ray diffraction testing.
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