Maintenance and Management of JEOL JSM-IT200 Scanning Electron Microscope

JEOL JSM-IT200 scanning electron microscope (SEM) has the advantages of low vacuum requirements, simple operation, and easy mastery of essential instrument operations. It is widely used in the fields of microscopic imaging and analysis. However, the maintenance and repair of the SEM still rely on foreign instrument manufacturers, with parts needing to be imported from abroad, resulting in high maintenance and repair costs, and low efficiency, which greatly affects scientific research activities. The structure, working principle, daily maintenance and repair, and safe operation of the SEM were systematically introduced, providing technical references for the maintenance and management of such instruments.