LI Jian-ping. Requirements and Preparation of Scanning ElectronMicroscope Sample[J]. Analysis and Testing Technology and Instruments, 2007, (1): 74-77.
Citation: LI Jian-ping. Requirements and Preparation of Scanning ElectronMicroscope Sample[J]. Analysis and Testing Technology and Instruments, 2007, (1): 74-77.

Requirements and Preparation of Scanning ElectronMicroscope Sample

  • The requirements for SEM samples are very strict,the sample must be a solid and non-toxic, non-radioactive, non-polluting, non-magnetic, non-moisture, the ingredients of the sample must be stable. The size of bulk sample should be moderate and the powder sample should be handled specially. In order to achieve the desired analysis results,the non-conductive sample should be coated with appropriate coating system.
  • loading

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return